SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.
Citation: SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.

DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST

  • Received Date: 2000-01-19
  • Rev Recd Date: 2000-05-15
  • Publish Date: 2001-05-15
  • The bending problem of thin film/substrate composite subjected to thermal load is studied. The relation between the thermal expansion coefficient of conductive thin films, temperature and deformation of specimen surfaces is derived in this paper. Based on the findings, a method for measuring the thermal expansion coefficient of conductive thin films is developed. The thermal expansion coefficient of conductive thin films has been measured by applying the method in a thermal bend test.

     

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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