SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.
Citation:
|
SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.
|
SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.
Citation:
|
SHEN Wei, PENG Li-hua, LI Wei, et al. DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST[J]. Acta Materiae Compositae Sinica, 2001, 18(2): 90-93.
|
DETERMINING THERMAL EXPANSION COEFFICIENT OF CONDUCTIVE THIN FILM BY THERMAL BEND TEST
- 1.
Department of Mechanics, Huazhong University of Science and Technology, 430074,China;
- 2.
Structure Mechanics Research Group, Wuhan University of Hydraulic and Electric Engineering, 430072,China;
- 3.
Department of Manufacturing Engineering, The Hong Kong Polytechnic University,Hong Kong, China
- Received Date: 2000-01-19
- Rev Recd Date:
2000-05-15
- Publish Date:
2001-05-15