用衰减全反射红外光谱研究纳米SiO<sub>2</sub>粒子在复合涂层中的迁移现象

用衰减全反射红外光谱研究纳米SiO₂粒子在复合涂层中的迁移现象

基金项目: 上海市科学技术委员会资助项目(02dz11001)

详细信息

摘要

摘要: 用衰减全反射红外光谱(FTIR-ATR)技术研究了纳米SiO₂粒子在紫外光固化复合涂层中的迁移现象,并对影响纳米SiO₂粒子在涂层中分布梯度的因素进行了半定量分析。研究结果表明,纳米SiO₂粒子在光固化过程中向涂层接触空气的表面迁移,在表面层富集。当纳米SiO₂粒子含量较高、分子量较小、接枝率较高,或者在极性较大的基体树脂中时,迁移较快,分布梯度较大。
- 衰减全反射红外光谱(FTIR-ATR) /
- 纳米SiO₂ /
- 紫外光固化复合涂层
Abstract: The migration phenomena of nano-SiO₂ particles in UV cured composite coatings are studied by FTIR-ATR and the factors affecting the distributing gradient of nano-SiO₂ particles in coating are discussed by semi-quantitative analysis. The results show that nano-SiO₂ particles migrate to the surface of composite coatings. The distributing gradient of nano-SiO₂ in the coating is larger when the nano-SiO₂ content or its molecular weight or graft ratio or the polarity of host resin is larger.
- FTIR-ATR /
- nano-SiO₂ /
- UV cured composite coatings