热等静压碳/铝复合材料的断口和界面的研究
Investigation on the Fracture and Interface of HIP C/AI Composites
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摘要: 采用热等静压(HIP)工艺,把包复在真空玻璃容器内的C/Al复合丝热压成致密的C/Al复合材料。用扫描电镜(SEM)观察到复合材料的低强度平断口和界面反应层。运用透射电镜(TEM)和X射线能谱仪(XES)观察和确定界面的形貌和成分,发现界面分成层状,界面层的TiB2向两边扩散,而纤维和基体的成分则通过界面而互相扩散。另外,还用电子衍射技术(EDT)研究了界面的晶体结构,确定它的相组成为TiO2、TiC、TiB2、γ-Al2O3及Ti、B和C等。采用俄歇电子能谱(AES)分析了界面区的化学组分,并运用二次离子质量谱(STMS)确定出界面的化学组成,除发现Al4C3,与EDT的结果基本一致。Abstract: The dense C/Al composites have been fabricated by hot isostatic pressing (HIP) with which the C/Al precursor wires were encapsu-fated in a glass tube.It was observed that the fracture of the C/Al composite possesses a low strength and smoothness.The reaction layer of the interface was studied with scanning electron micro scope (SEM).The transmission electron microscope (TEM) and X-ray energy spectroscope (XES) were used to observe and determine the morphology and the composition of the interface.It was found that the interface was divided into two layers.TiB2 interface was diffused to the both sides of the interface and the compositions of the carbon fiber and matrix also were diffused through the interface. Beside sthe electron diffraction (ED) was used to study the inter-face structure.The structure compositions were defined as TiO2, TiC,TiB2,r-Al2O3, Ti, B and C.The chemical compositions were analyzed by auger electron spectroscopy (AES) and secondion masses spectroscopy (SIMS).The composition determined were used by SIMS and ED with a nearly result except founding Al4C3 at SIMS.
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