Citation: | LI Qinghui, KONG Weina, LI Zhe, et al. Dielectric properties measurements on silicon nitride fiber based on high-Q cavity method[J]. Acta Materiae Compositae Sinica, 2020, 37(9): 2240-2249. doi: 10.13801/j.cnki.fhclxb.20200115.003 |
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